Peter Schattschneider was born in Vienna in 1950.
He studied physics at the Vienna University of Technology, and finished in 1973 with a diploma thesis about diffusion profiles in thin films. In
1974 he enrolled in the study of college teacher for physics and mathematics at the University of Vienna where he obtained a mag. rer. nat. degree in 1977. After his PhD thesis on X-ray diffraction of binary alloys he left Vienna University of Technology in 1976 and came back in
1980 as assistant at the Institute for Applied and Technical Physics. In the meantime he worked in an engineering enterprise, dealing with remote sensing (air- and spaceborne sensors). In 1981 he obtained the Theodor-Körner award for work on the EEL spectrometer installed at the old ELMISKOP IA. In 1988 he became Assistant Professor at the Institute for Applied and Technical Physics of the Vienna University of Technology where his main research interests are electron microscopy, inelastic electron-matter interactions and electron energy-loss spectrometry. He is also interested in the history of physics, the science in Science Fiction, and the role of science in society. In 1992 and 1993 he was employed by the CNRS (Centre Nationale de la Recherche
Scientifique) in Paris. Since 1995 he is professeur invité at the École Centrale Paris.
From January 2000 until June 2006 he was head of the University Service Center for Transmission Electron Microscopy (USTEM).
For further information on Professor Schattschneider please visit http://www.ustem.tuwien.ac.at/staff/schattschneider/EN/